ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,719,028, issued on Aug. 25, was assigned to Semes Co. Ltd. (Chungcheongnam-do, South Korea). "Substrate processing device" was invented by Hyou... Read More
ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,719,029, issued on Aug. 25, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Substrate processing apparatus" was invented... Read More
ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,719,030, issued on Aug. 25, was assigned to Applied Materials Inc. (Santa Clara, Calif.). "Susceptor heat transfer" was invented by Arvinder Ma... Read More
ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,719,031, issued on Aug. 25, was assigned to Lam Research Corp. (Fremont, Calif.). "Subtractive copper etch" was invented by Wenbing Yang (Campb... Read More
ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,719,032, issued on Aug. 25, was assigned to Tokyo Electron Ltd. (Tokyo). "Plasma processing method and plasma processing apparatus" was invente... Read More
ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,719,033, issued on Aug. 25, was assigned to Applied Materials Inc. (Santa Clara, Calif.). "Chamber with enhancement liner and methods for downs... Read More
ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,719,034, issued on Aug. 25, was assigned to DUBLIN CITY UNIVERSITY (Ireland). "Non-invasive measurement of plasma systems" was invented by Patr... Read More
ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,719,035, issued on Aug. 25, was assigned to Tokyo Electron Ltd. (Tokyo). "Profile simulation calibration with in-situ sensor data" was invented... Read More
ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,719,036, issued on Aug. 25, was assigned to DH TECHNOLOGIES DEVELOPMENT PTE. LTD. (Singapore). "Mass spectrometer calibration" was invented by ... Read More
ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,719,037, issued on Aug. 25, was assigned to Trace Matters Scientific LLC (North Bethesda, Md.). "Mass spectrometry with time-offset electrospra... Read More